SANTA BARBARA, Calif.--(BUSINESS WIRE)--Oxford Instruments Asylum Research announces today the release of Vero, the first and only AFM with Quadrature Phase Differential Interferometry (QPDI) ...

An AFM instrument uses a probe with an atomically sharp tip to scan over the surface of a material. There are two main scanning modes with an AFM instrument: contact or dynamic (tapping) mode. Both ...

SANTA BARBARA, Calif.--(BUSINESS WIRE)--Oxford Instruments Asylum Research announced today that its next-generation Atomic Force Microscope (AFM), Vero, has received three prestigious awards. Vero AFM ...

From the inception of the groundbreaking nGauge AFM to the launch of the innovative Redux AFM, David Morris, Director of Operations, shares insights on ICSPI's mission to enhance accessibility and ...

JPK Instruments reports on the use of their AFM system, the NanoWizard® in the Physics Department at Swansea University. Dr Peter Dunstan is an associate Professor in the Department of Physics at ...

Cecilia Van Cauwenberghe explains how to measure the future using nanoscale metrology and discusses the global competition ...

Atomic force microscopy (AFM) is a type of scanning probe microscopy that is used to see and measure surface topography, conduct force measurements or manipulate a sample’s surface. It can have nearly ...

A standard single frequency AFM is comprised of a boron-doped silicon (Si) or silicon nitride (Si 3 N 4) cantilever with a length of a few micrometers and a single crystal diamond tip at the bottom of ...

Let us help you with your inquiries, brochures and pricing requirements Request A Quote Download PDF Copy Download Brochure Park FX300 is intended to bridge the gap ...

The AFM is a safe instrument, but the user should observe general precautions prior to using the instrument. The system uses high voltages and currents of up to 165 V and 0.5 A, respectively. Make ...