Infrared (IR) spectroscopy is one of the most accepted analytical measurement methods for the characterization of materials in government, academic, and industrial R&D laboratories. The spatial ...

Atomic force microscopy (AFM) is a standard imaging technique for the structural characterization of surfaces in different fields of materials science, surface science, and biology. Carbon nanotubes ...

A research team from the Shenzhen Institutes of Advanced Technology of the Chinese Academy of Sciences, under the direction of Prof. Hui Yang, created a unique platform combining AFM with ...

(Nanowerk Spotlight) The foremost atom of the tip in a scanning probe microscope is critically important for precise imaging results – similar to role of the objective lens in an optical microscope.

Since the invention of atomic force microscopy (AFM) 1, it has had widespread application in non-destructive sample surface imaging and significant interest in its magnetic, electrical, and mechanical ...

SANTA CLARA, Calif., June 23, 2020 /PRNewswire-PRWeb/ -- Park Systems Inc., world-leading manufacturer of Atomic Force Microscopes (AFM) is announcing Park NX-TSH, automated Tip Scan Head for large ...

The deep learning algorithm developed by researchers at the University of Illinois Urbana-Champaign is trained to remove the effects of the probe’s width from AFM microscope images. As reported in the ...