(Nanowerk Spotlight) The foremost atom of the tip in a scanning probe microscope is critically important for precise imaging results – similar to role of the objective lens in an optical microscope.

Atomic force microscopy (AFM) is a versatile microscopic technology used for analyzing various samples at the nanoscale dimension. This analytical tool not only offers a three-dimensional image of the ...

What Is Atomic Force Microscopy? Atomic force microscopy (AFM) is a powerful technique that enables surface ultrastructure visualization at molecular resolution. 1 Besides three-dimensional (3D) ...

The high-resolution imaging capability of atomic force microscopy (AFM) can be extended to enable a wide range of characterization methods to study electrical, mechanical, thermal, and other ...

Vitamin C tablets’ surface roughness is key to defining their surface morphology and, therefore, their delivery rate and interaction time with external stimuli. Surface roughness can be observed via ...