SANTA CLARA, Calif.--(BUSINESS WIRE)--Anchor Semiconductor Inc. today introduced an easy-to-adopt Optical Proximity Correction (OPC) acceleration tool that will significantly shorten OPC cycle time ...
Semiconductor wafer defect pattern recognition and classification is a crucial area of research that underpins yield enhancement and quality assurance in microelectronics manufacturing. The discipline ...
ORLANDO, Fla.--(BUSINESS WIRE)--Fonon Corporation, a multi-market holding company, R&D center, equipment designer and manufacturer of advanced laser material processing systems for subtractive and ...
The Palo Alto Research Center (PARC) have developed the first plastic semiconductor transistor array entirely patterned using jet printing. Jet printing provides an alternative to more conventional ...
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