Abstract: In this study, we evaluate parasitic capacitance between the node contact (NC) and the bit-line (BL) in advanced dynamic random-access memory (DRAM) devices. Process modeling was used to ...
Abstract: For decades, the fundamental driving force behind energy-efficient and cost-effective electronic components has been the downward scaling of electronic devices. However, due to approaching ...
Within each content area, there are one or more tutorials. Each tutorial consists of lessons. Each lesson should be a page detailing the concept being taught, along with sample code. Lesson and page ...
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